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Using a deformation field model for localizing faces and facial points under weak supervision

Pedersoli, Marco, Tuytelaars, Tinne et Van Gool, Luc. 2014. « Using a deformation field model for localizing faces and facial points under weak supervision ». In IEEE Conference on Computer Vision and Pattern Recognition (CVPR) (Columbus, OH, United states, June 23-28, 2014) pp. 3694-3701. IEEE Computer Society.
Compte des citations dans Scopus : 9.

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Item Type: Conference proceeding
ISBN: 10636919
Professor:
Professor
Pedersoli, Marco
Affiliation: Autres
Date Deposited: 06 Apr 2017 14:45
Last Modified: 06 Apr 2017 14:45
URI: https://espace2.etsmtl.ca/id/eprint/14967

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