Pedersoli, Marco, Tuytelaars, Tinne et Van Gool, Luc.
2014.
« Using a deformation field model for localizing faces and facial points under weak supervision ».
In IEEE Conference on Computer Vision and Pattern Recognition (CVPR) (Columbus, OH, United states, June 23-28, 2014)
pp. 3694-3701.
IEEE Computer Society.
Compte des citations dans Scopus : 9.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/CVPR.2014.472
Item Type: | Conference proceeding | ||
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ISBN: | 10636919 | ||
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Affiliation: | Autres | ||
Date Deposited: | 06 Apr 2017 14:45 | ||
Last Modified: | 06 Apr 2017 14:45 | ||
URI: | https://espace2.etsmtl.ca/id/eprint/14967 |
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