A new delay testing signal scheme robust to power distribution network impedance variation

Thibeault, Claude and Louati, Ali. 2017. « A new delay testing signal scheme robust to power distribution network impedance variation ». In IEEE 35th VLSI Test Symposium (VTS) (Las Vegas, NV, USA,, Apr. 09-12, 2017) IEEE Computer Society.
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Official URL: http://dx.doi.org/10.1109/VTS.2017.7928920

Item Type:	Conference proceeding
Professor:	Professor Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	18 Jul 2017 15:59
Last Modified:	22 Jan 2020 20:14
URI:	https://espace2.etsmtl.ca/id/eprint/15648

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