Thibeault, Claude et Louati, Ali.
2017.
« A new delay testing signal scheme robust to power distribution network impedance variation ».
In IEEE 35th VLSI Test Symposium (VTS) (Las Vegas, NV, USA,, Apr. 09-12, 2017)
IEEE Computer Society.
Compte des citations dans Scopus : 1.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/VTS.2017.7928920
| Item Type: | Conference proceeding |
|---|---|
| Professor: | Professor Thibeault, Claude |
| Affiliation: | Génie électrique |
| Date Deposited: | 18 Jul 2017 15:59 |
| Last Modified: | 22 Jan 2020 20:14 |
| URI: | https://espace2.etsmtl.ca/id/eprint/15648 |
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