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A new delay testing signal scheme robust to power distribution network impedance variation

Thibeault, Claude et Louati, Ali. 2017. « A new delay testing signal scheme robust to power distribution network impedance variation ». In IEEE 35th VLSI Test Symposium (VTS) (Las Vegas, NV, USA,, Apr. 09-12, 2017) IEEE Computer Society.
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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 18 Jul 2017 15:59
Last Modified: 22 Jan 2020 20:14
URI: https://espace2.etsmtl.ca/id/eprint/15648

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