Rabl, Tilmann, Zhang, Kaiwen, Sadoghi, Mohammad, Pandey, Navneet Kumar, Nigam, Aakash, Wang, Chen and Jacobsen, Hans-Arno.
2012.
« DEBS grand challenge: Solving manufacturing equipment monitoring through efficient complex event processing ».
In Proceedings of the 6th ACM International Conference on Distributed Event-Based Systems (DEBS'12) (Berlin, Germany, July 16-20, 2012)
pp. 335-340.
Association for Computing Machinery.
Compte des citations dans Scopus : 4.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1145/2335484.2335520
Item Type: | Conference proceeding |
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Professor: | Professor Zhang, Kaiwen |
Affiliation: | Autres |
Date Deposited: | 16 Jan 2018 16:54 |
Last Modified: | 16 Jan 2018 16:54 |
URI: | https://espace2.etsmtl.ca/id/eprint/16152 |
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