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DEBS grand challenge: Solving manufacturing equipment monitoring through efficient complex event processing

Rabl, Tilmann, Zhang, Kaiwen, Sadoghi, Mohammad, Pandey, Navneet Kumar, Nigam, Aakash, Wang, Chen and Jacobsen, Hans-Arno. 2012. « DEBS grand challenge: Solving manufacturing equipment monitoring through efficient complex event processing ». In Proceedings of the 6th ACM International Conference on Distributed Event-Based Systems (DEBS'12) (Berlin, Germany, July 16-20, 2012) pp. 335-340. Association for Computing Machinery.
Compte des citations dans Scopus : 4.

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Item Type: Conference proceeding
Professor:
Professor
Zhang, Kaiwen
Affiliation: Autres
Date Deposited: 16 Jan 2018 16:54
Last Modified: 16 Jan 2018 16:54
URI: https://espace2.etsmtl.ca/id/eprint/16152

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