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Experimental study of biaxial and uniaxial strain effects on carrier mobility in bulk and ultrathin-body SOI MOSFETs

Uchida, Ken, Zednik, Ricardo, Lu, Ching-Huang, Jagannathan, Hemanth, McVittie, James, McIntyre, Paul C. et Nishi, Yoshio. 2004. « Experimental study of biaxial and uniaxial strain effects on carrier mobility in bulk and ultrathin-body SOI MOSFETs ». In IEEE International Electron Devices Meeting (San Francisco, CA, USA, Dec. 13-15, 2004), pp. 229-232. IEEE.
Compte des citations dans Scopus : 73.

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Item Type: Conference proceeding
Professor:
Professor
Zednik, Ricardo
Affiliation: Autres
Date Deposited: 23 Jan 2018 17:11
Last Modified: 23 Jan 2018 17:11
URI: https://espace2.etsmtl.ca/id/eprint/16193

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