Uchida, Ken, Zednik, Ricardo, Lu, Ching-Huang, Jagannathan, Hemanth, McVittie, James, McIntyre, Paul C. et Nishi, Yoshio.
2004.
« Experimental study of biaxial and uniaxial strain effects on carrier mobility in bulk and ultrathin-body SOI MOSFETs ».
In IEEE International Electron Devices Meeting (San Francisco, CA, USA, Dec. 13-15, 2004)
pp. 229-232.
IEEE.
Compte des citations dans Scopus : 73.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/IEDM.2004.1419116
Item Type: | Conference proceeding | ||
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Affiliation: | Autres | ||
Date Deposited: | 23 Jan 2018 17:11 | ||
Last Modified: | 23 Jan 2018 17:11 | ||
URI: | https://espace2.etsmtl.ca/id/eprint/16193 |
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