Experimental study of biaxial and uniaxial strain effects on carrier mobility in bulk and ultrathin-body SOI MOSFETs

Uchida, Ken, Zednik, Ricardo, Lu, Ching-Huang, Jagannathan, Hemanth, McVittie, James, McIntyre, Paul C. et Nishi, Yoshio. 2004. « Experimental study of biaxial and uniaxial strain effects on carrier mobility in bulk and ultrathin-body SOI MOSFETs ». In IEEE International Electron Devices Meeting (San Francisco, CA, USA, Dec. 13-15, 2004) pp. 229-232. IEEE.
Compte des citations dans Scopus : 73.

The full text of this document is not available here.

Item Type:	Conference proceeding
Professor:	Professor Zednik, Ricardo
Affiliation:	Autres
Date Deposited:	23 Jan 2018 17:11
Last Modified:	23 Jan 2018 17:11
URI:	https://espace2.etsmtl.ca/id/eprint/16193

Actions (login required)

View Item