Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan chain in large area integrated circuits

Berrima, Safa, Blaquière, Yves et Savaria, Yvon. 2018. « Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan chain in large area integrated circuits ». Integration, vol. 62. pp. 159-169.

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Item Type:	Peer reviewed article published in a journal
Professor:	Professor Blaquière, Yves
Affiliation:	Génie électrique
Date Deposited:	27 Mar 2018 16:07
Last Modified:	22 Jan 2020 19:35
URI:	https://espace2.etsmtl.ca/id/eprint/16514

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