Berrima, Safa, Blaquière, Yves et Savaria, Yvon.
2018.
« Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan chain in large area integrated circuits ».
Integration, vol. 62.
pp. 159-169.
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Official URL: http://dx.doi.org/10.1016/j.vlsi.2018.02.010
| Item Type: | Peer reviewed article published in a journal |
|---|---|
| Professor: | Professor Blaquière, Yves |
| Affiliation: | Génie électrique |
| Date Deposited: | 27 Mar 2018 16:07 |
| Last Modified: | 22 Jan 2020 19:35 |
| URI: | https://espace2.etsmtl.ca/id/eprint/16514 |
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