Berrima, Safa, Blaquière, Yves et Savaria, Yvon.
2018.
« Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan chain in large area integrated circuits ».
Integration, vol. 62.
pp. 159-169.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1016/j.vlsi.2018.02.010
Item Type: | Peer reviewed article published in a journal | ||
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Affiliation: | Génie électrique | ||
Date Deposited: | 27 Mar 2018 16:07 | ||
Last Modified: | 22 Jan 2020 19:35 | ||
URI: | https://espace2.etsmtl.ca/id/eprint/16514 |
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