Darvishi, Mostafa, Audet, Yves et Blaquière, Yves.
2018.
« Delay monitor circuit and delay change measurement due to SEU in SRAM-based FPGA ».
IEEE Transactions on Nuclear Science, vol. 65, nº 5.
pp. 1153-1160.
Compte des citations dans Scopus : 1.
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Official URL: http://dx.doi.org/10.1109/TNS.2018.2828785
Item Type: | Peer reviewed article published in a journal |
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Professor: | Professor Blaquière, Yves |
Affiliation: | Génie électrique |
Date Deposited: | 09 Jul 2018 15:19 |
Last Modified: | 22 Jan 2020 19:35 |
URI: | https://espace2.etsmtl.ca/id/eprint/16814 |
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