Delay monitor circuit and delay change measurement due to SEU in SRAM-based FPGA

Darvishi, Mostafa, Audet, Yves et Blaquière, Yves. 2018. « Delay monitor circuit and delay change measurement due to SEU in SRAM-based FPGA ». IEEE Transactions on Nuclear Science, vol. 65, nº 5. pp. 1153-1160.
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Item Type:	Peer reviewed article published in a journal
Professor:	Professor Blaquière, Yves
Affiliation:	Génie électrique
Date Deposited:	09 Jul 2018 15:19
Last Modified:	22 Jan 2020 19:35
URI:	https://espace2.etsmtl.ca/id/eprint/16814

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