Thibeault, Claude et Gagnon, Ghyslain.
2018.
« On the analysis and the mitigation of power supply noise and power distribution network impedance variation for scan-based delay testing techniques ».
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 26, nº 7.
pp. 1377-1390.
Compte des citations dans Scopus : 1.
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Official URL: http://dx.doi.org/10.1109/TVLSI.2018.2817177
Item Type: | Peer reviewed article published in a journal |
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Professor: | Professor Thibeault, Claude Gagnon, Ghyslain |
Affiliation: | Génie électrique, Génie électrique |
Date Deposited: | 30 Jul 2018 21:02 |
Last Modified: | 22 Jan 2020 20:14 |
URI: | https://espace2.etsmtl.ca/id/eprint/17135 |
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