On the analysis and the mitigation of power supply noise and power distribution network impedance variation for scan-based delay testing techniques

Thibeault, Claude et Gagnon, Ghyslain. 2018. « On the analysis and the mitigation of power supply noise and power distribution network impedance variation for scan-based delay testing techniques ». IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 26, nº 7. pp. 1377-1390.
Compte des citations dans Scopus : 1.

The full text of this document is not available here.

Item Type:	Peer reviewed article published in a journal
Professor:	Professor Thibeault, Claude Gagnon, Ghyslain
Affiliation:	Génie électrique, Génie électrique
Date Deposited:	30 Jul 2018 21:02
Last Modified:	22 Jan 2020 20:14
URI:	https://espace2.etsmtl.ca/id/eprint/17135

Actions (login required)

View Item