Amirkhan, F., Nechache, R., Sakata, R., Takiguchi, K., Arikawa, T., Ozaki, T., Tanaka, K. et Blanchard, F..
2018.
« Characterization of thin-film optical properties by THz near-field imaging ».
In 2018 Photonics North Conference (PN) (Montreal, QC, Canada, June 5-7, 2018)
IEEE.
Rechercher dans Google Scholar
Official URL: https://doi.org/10.1109/PN.2018.8438834
| Item Type: | Conference proceeding |
|---|---|
| Professor: | Professor Blanchard, François |
| Affiliation: | Génie électrique |
| Date Deposited: | 04 Sep 2018 14:30 |
| Last Modified: | 22 Jan 2020 19:31 |
| URI: | https://espace2.etsmtl.ca/id/eprint/17300 |
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