Laflamme-Mayer, Nicolas, Kowarzyk, Gilbert, Blaquière, Yves, Savaria, Yvon and Sawan, Mohamad.
2019.
« A defect-tolerant reusable network of DACs for wafer-scale integration ».
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 27, nº 2.
pp. 304-315.
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Official URL: http://dx.doi.org/10.1109/TVLSI.2018.2876458
| Item Type: | Peer reviewed article published in a journal |
|---|---|
| Professor: | Professor Blaquière, Yves |
| Affiliation: | Génie électrique |
| Date Deposited: | 04 Dec 2018 20:23 |
| Last Modified: | 22 Jan 2020 19:35 |
| URI: | https://espace2.etsmtl.ca/id/eprint/17702 |
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