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A defect-tolerant reusable network of DACs for wafer-scale integration

Laflamme-Mayer, Nicolas, Kowarzyk, Gilbert, Blaquière, Yves, Savaria, Yvon et Sawan, Mohamad. 2019. « A defect-tolerant reusable network of DACs for wafer-scale integration ». IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 27, nº 2. pp. 304-315.

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Item Type: Peer reviewed article published in a journal
Professor:
Professor
Blaquière, Yves
Affiliation: Génie électrique
Date Deposited: 04 Dec 2018 20:23
Last Modified: 22 Jan 2020 19:35
URI: https://espace2.etsmtl.ca/id/eprint/17702

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