Contactless in situ electrical characterization method of printed electronic devices with terahertz spectroscopy

Zhuldybina, Mariia, Ropagnol, Xavier, Trudeau, Charles, Bolduc, Martin, Zednik, Ricardo J. et Blanchard, François. 2019. « Contactless in situ electrical characterization method of printed electronic devices with terahertz spectroscopy ». Sensors, vol. 19, nº 3.
Compte des citations dans Scopus : 2.

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Abstract

Printed electronic devices are attracting significant interest due to their versatility and low cost; however, quality control during manufacturing is a significant challenge, preventing the widespread adoption of this promising technology. We show that terahertz (THz) radiation can be used for the in situ inspection of printed electronic devices, as confirmed through a comparison with conventional electrical conductivity methods. Our in situ method consists of printing a simple test pattern exhibiting a distinct signature in the THz range that enables the precise characterization of the static electrical conductivities of the printed ink. We demonstrate that contactless dual-wavelength THz spectroscopy analysis, which requires only a single THz measurement, is more precise and repeatable than the conventional four-point probe conductivity measurement method. Our results open the door to a simple strategy for performing contactless quality control in real time of printed electronic devices at any stage of its production line.

Item Type:	Peer reviewed article published in a journal
Professor:	Professor Zednik, Ricardo Blanchard, François
Affiliation:	Génie électrique, Génie mécanique
Date Deposited:	22 Jan 2019 14:42
Last Modified:	22 Jan 2020 20:17
URI:	https://espace2.etsmtl.ca/id/eprint/17905

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