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On the susceptibility of SRAM-based FPGA routing network to delay changes induced by ionizing radiation

Darvishi, Mostafa, Audet, Yves, Blaquière, Yves, Thibeault, Claude et Pichette, Simon. 2019. « On the susceptibility of SRAM-based FPGA routing network to delay changes induced by ionizing radiation ». IEEE Transactions on Nuclear Science, vol. 66, nº 3. pp. 643-654.
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Item Type: Peer reviewed article published in a journal
Professor:
Professor
Blaquière, Yves
Thibeault, Claude
Affiliation: Génie électrique, Génie électrique
Date Deposited: 05 Apr 2019 20:09
Last Modified: 22 Jan 2020 20:14
URI: https://espace2.etsmtl.ca/id/eprint/18500

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