On the susceptibility of SRAM-based FPGA routing network to delay changes induced by ionizing radiation

Darvishi, Mostafa, Audet, Yves, Blaquière, Yves, Thibeault, Claude et Pichette, Simon. 2019. « On the susceptibility of SRAM-based FPGA routing network to delay changes induced by ionizing radiation ». IEEE Transactions on Nuclear Science, vol. 66, nº 3. pp. 643-654.
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Item Type:	Peer reviewed article published in a journal
Professor:	Professor Blaquière, Yves Thibeault, Claude
Affiliation:	Génie électrique, Génie électrique
Date Deposited:	05 Apr 2019 20:09
Last Modified:	22 Jan 2020 20:14
URI:	https://espace2.etsmtl.ca/id/eprint/18500

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