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Multi scale multi descriptor local binary features and exponential discriminant analysis for robust face authentication

Ouamane, Abdelmalik, Messaoud, Bengherabi, Guessoum, Abderrezak, Hadid, Abdenour and Cheriet, Mohamed. 2014. « Multi scale multi descriptor local binary features and exponential discriminant analysis for robust face authentication ». In 2014 IEEE International Conference on Image Processing (ICIP) (Paris, France, Oct. 27-30, 2014) pp. 313-317. Institute of Electrical and Electronics Engineers Inc..
Compte des citations dans Scopus : 23.

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Item Type: Conference proceeding
ISBN: 9781479957514
Professor:
Professor
Cheriet, Mohamed
Affiliation: Génie de la production automatisée
Date Deposited: 11 Jul 2019 14:44
Last Modified: 11 Jul 2019 14:44
URI: https://espace2.etsmtl.ca/id/eprint/18973

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