Characterization of thin-film optical properties by THz near-field imaging method

Amirkhan, F., Sakata, R., Takiguchi, K., Arikawa, T., Ozaki, T., Tanaka, K. et Blanchard, F.. 2019. « Characterization of thin-film optical properties by THz near-field imaging method ». Journal of the Optical Society of America B: Optical Physics, vol. 36, nº 9. pp. 2593-2601.
Compte des citations dans Scopus : 1.

The full text of this document is not available here.

Item Type:	Peer reviewed article published in a journal
Professor:	Professor Blanchard, François
Affiliation:	Génie électrique
Date Deposited:	25 Oct 2019 21:03
Last Modified:	22 Jan 2020 19:31
URI:	https://espace2.etsmtl.ca/id/eprint/19659

Actions (login required)

View Item