Towards a novel comparison framework of digital maturity assessment models

Cognet, B., Pernot, J. P., Rivest, L., Danjou, C., Wuest, T., Karkkainen, H. et Lafleur, M.. 2019. « Towards a novel comparison framework of digital maturity assessment models ». In Product Lifecycle Management in the Digital Twin Era : 16th IFIP WG 5.1 International Conference, PLM 2019, Moscow, Russia, July 8–12, 2019, Revised Selected Papers (Moscow, Russia, July 08-12, 2019) Coll. « IFIP Advances in Information and Communication Technology », vol. 565. pp. 58-71. Springer.

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Item Type:	Conference proceeding
ISBN:	18684238
Additional Information:	16th IFIP WG 5.1 International Conference on Product Lifecycle Management (PLM)
Professor:	Professor Rivest, Louis
Affiliation:	Génie des systèmes
Date Deposited:	17 Apr 2020 15:10
Last Modified:	17 Apr 2020 15:10
URI:	https://espace2.etsmtl.ca/id/eprint/20474

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