Boyadjian, Quentin, Vanderesse, Nicolas, Toews, Matthew et Bocher, Philippe.
2020.
« Detecting defects in materials using deep convolutional neural networks ».
In Image Analysis and Recognition : 17th International Conference, ICIAR 2020, Póvoa de Varzim, Portugal, June 24–26, 2020, Proceedings, Part I (Póvoa de Varzim, Portugal, June 24-26, 2020)
Coll. « Lecture Notes in Computer Science », vol. 12131.
pp. 293-306.
Springer.
The full text of this document is not available here.
Item Type: |
Conference proceeding
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Editors: |
Campilho, Aurélio | UNSPECIFIED | Karray, Fakhri | UNSPECIFIED | Wang, Zhou | UNSPECIFIED |
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Professor: |
Toews, Matthew | Bocher, Philippe |
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Affiliation: |
Génie des systèmes, Génie mécanique |
Date Deposited: |
02 Oct 2020 18:27 |
Last Modified: |
02 Oct 2020 18:27 |
URI: |
https://espace2.etsmtl.ca/id/eprint/21094 |
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