Boyadjian, Quentin, Vanderesse, Nicolas, Toews, Matthew and Bocher, Philippe.
2020.
« Detecting defects in materials using deep convolutional neural networks ».
In Image Analysis and Recognition : 17th International Conference, ICIAR 2020, Póvoa de Varzim, Portugal, June 24–26, 2020, Proceedings, Part I (Póvoa de Varzim, Portugal, June 24-26, 2020)
Coll. « Lecture Notes in Computer Science », vol. 12131.
pp. 293-306.
Springer.
Compte des citations dans Scopus : 3.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1007/978-3-030-50347-5_26
Item Type: | Conference proceeding |
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Editors: | Editors ORCID Campilho, Aurélio UNSPECIFIED Karray, Fakhri UNSPECIFIED Wang, Zhou UNSPECIFIED |
Professor: | Professor Toews, Matthew Bocher, Philippe |
Affiliation: | Génie des systèmes, Génie mécanique |
Date Deposited: | 02 Oct 2020 18:27 |
Last Modified: | 02 Oct 2020 18:27 |
URI: | https://espace2.etsmtl.ca/id/eprint/21094 |
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