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Detecting defects in materials using deep convolutional neural networks

Boyadjian, Quentin, Vanderesse, Nicolas, Toews, Matthew et Bocher, Philippe. 2020. « Detecting defects in materials using deep convolutional neural networks ». In Image Analysis and Recognition : 17th International Conference, ICIAR 2020, Póvoa de Varzim, Portugal, June 24–26, 2020, Proceedings, Part I (Póvoa de Varzim, Portugal, June 24-26, 2020) Coll. « Lecture Notes in Computer Science », vol. 12131. pp. 293-306. Springer.

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Item Type: Conference proceeding
Editors:
EditorsORCID
Campilho, AurélioUNSPECIFIED
Karray, FakhriUNSPECIFIED
Wang, ZhouUNSPECIFIED
Professor:
Professor
Toews, Matthew
Bocher, Philippe
Affiliation: Génie des systèmes, Génie mécanique
Date Deposited: 02 Oct 2020 18:27
Last Modified: 02 Oct 2020 18:27
URI: https://espace2.etsmtl.ca/id/eprint/21094

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