Detecting defects in materials using deep convolutional neural networks

Boyadjian, Quentin, Vanderesse, Nicolas, Toews, Matthew et Bocher, Philippe. 2020. « Detecting defects in materials using deep convolutional neural networks ». In Image Analysis and Recognition : 17th International Conference, ICIAR 2020, Póvoa de Varzim, Portugal, June 24–26, 2020, Proceedings, Part I (Póvoa de Varzim, Portugal, June 24-26, 2020) Coll. « Lecture Notes in Computer Science », vol. 12131. pp. 293-306. Springer.

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Item Type:	Conference proceeding
Editors:	Editors ORCID Campilho, Aurélio UNSPECIFIED Karray, Fakhri UNSPECIFIED Wang, Zhou UNSPECIFIED
Professor:	Professor Toews, Matthew Bocher, Philippe
Affiliation:	Génie des systèmes, Génie mécanique
Date Deposited:	02 Oct 2020 18:27
Last Modified:	02 Oct 2020 18:27
URI:	https://espace2.etsmtl.ca/id/eprint/21094

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