Automatic generation of detection algorithms for design defects

Moha, Naouel, Guéhéneuc, Yann-Gäel et Leduc, Pierre. 2006. « Automatic generation of detection algorithms for design defects ». In 21st IEEE/ACM International Conference on Automated Software Engineering (ASE) (Tokyo, Japan, Sept. 18-22, 2006) pp. 297-300. Institute of Electrical and Electronics Engineers.

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Official URL: https://doi.org/10.1109/ASE.2006.22

Item Type:	Conference proceeding
ISBN:	0769525792 (ISBN); 9780769525792 (ISBN)
Professor:	Professor Moha, Naouel
Affiliation:	Autres
Date Deposited:	21 Oct 2020 20:18
Last Modified:	21 Oct 2020 20:18
URI:	https://espace2.etsmtl.ca/id/eprint/21237

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