Moha, Naouel, Guéhéneuc, Yann-Gäel et Leduc, Pierre.
2006.
« Automatic generation of detection algorithms for design defects ».
In 21st IEEE/ACM International Conference on Automated Software Engineering (ASE) (Tokyo, Japan, Sept. 18-22, 2006)
pp. 297-300.
Institute of Electrical and Electronics Engineers.
Rechercher dans Google Scholar
Official URL: https://doi.org/10.1109/ASE.2006.22
| Item Type: | Conference proceeding | ||
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| ISBN: | 0769525792 (ISBN); 9780769525792 (ISBN) | ||
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| Affiliation: | Autres | ||
| Date Deposited: | 21 Oct 2020 20:18 | ||
| Last Modified: | 21 Oct 2020 20:18 | ||
| URI: | https://espace2.etsmtl.ca/id/eprint/21237 |
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