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Automatic generation of detection algorithms for design defects

Moha, Naouel, Guéhéneuc, Yann-Gäel et Leduc, Pierre. 2006. « Automatic generation of detection algorithms for design defects ». In 21st IEEE/ACM International Conference on Automated Software Engineering (ASE) (Tokyo, Japan, Sept. 18-22, 2006) pp. 297-300. Institute of Electrical and Electronics Engineers.

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Item Type: Conference proceeding
ISBN: 0769525792 (ISBN); 9780769525792 (ISBN)
Professor:
Professor
Moha, Naouel
Affiliation: Autres
Date Deposited: 21 Oct 2020 20:18
Last Modified: 21 Oct 2020 20:18
URI: https://espace2.etsmtl.ca/id/eprint/21237

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