IEEE VLSI Test Symposium : meeting the quality challenge

Savaria, Yvon, Thibeault, Claude et Ivanov, Andre. 1996. « IEEE VLSI Test Symposium : meeting the quality challenge ». IEEE Design & Test of Computers, vol. 13, nº 4. pp. 110-112.

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Item Type:	Peer reviewed article published in a journal
Professor:	Professor Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	29 Oct 2012 20:47
Last Modified:	29 Oct 2012 20:47
URI:	https://espace2.etsmtl.ca/id/eprint/2206

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