Robust design of terminal ILC with an internal model control using μ-analysis and a genetic algorithm approach

Gauthier, Guy and Boulet, Benoît. 2010. « Robust design of terminal ILC with an internal model control using μ-analysis and a genetic algorithm approach ». In American Control Conference (ACC) (Baltimore, Maryland, USA, June 30-July 2, 2010) pp. 2069-2075. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.
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Item Type:	Conference proceeding
ISBN:	9781424474264
Additional Information:	ACC 2010
Professor:	Professor Gauthier, Guy
Affiliation:	Génie de la production automatisée
Date Deposited:	23 May 2012 17:55
Last Modified:	23 May 2012 17:55
URI:	https://espace2.etsmtl.ca/id/eprint/222

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