Characterization of dielectric walls of capacitors

Gnonhoue, O. G., Velazquez-Salazar, A., Millard, L., Joncas, S., David, É., Cormier, L., Poudret, R. and Preda, I.. 2020. « Characterization of dielectric walls of capacitors ». In IEEE 3rd International Conference on Dielectrics (ICD) (Valencia, Spain, July 05-31, 2020) pp. 653-656. IEEE.
Compte des citations dans Scopus : 3.

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Item Type:	Conference proceeding
Professor:	Professor Joncas, Simon David, Éric
Affiliation:	Génie des systèmes, Génie mécanique
Date Deposited:	25 Feb 2021 21:13
Last Modified:	25 Feb 2021 21:13
URI:	https://espace2.etsmtl.ca/id/eprint/22293

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