Schell, E., Shih, A. and Akinwande, A. I.. 2017. « Characterization of room-temperature processed BZN (Bi1.5Zn1Nb1.5O7) thin-film capacitors under curvature ». Affiche présentée lors de la conférence : MRS Materials Research Society Fall Meeting & Exhibit (Boston, MA, USA, Nov. 26-Dec. 01, 2017).
The full text of this document is not available here.| Item Type: | Poster |
|---|---|
| Professor: | Professor Shih, Andy |
| Affiliation: | Autres |
| Date Deposited: | 04 Oct 2021 17:54 |
| Last Modified: | 04 Oct 2021 17:54 |
| URI: | https://espace2.etsmtl.ca/id/eprint/23253 |
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