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Characterization of room-temperature processed BZN (Bi1.5Zn1Nb1.5O7) thin-film capacitors under curvature

Schell, E., Shih, A. et Akinwande, A. I.. 2017. « Characterization of room-temperature processed BZN (Bi1.5Zn1Nb1.5O7) thin-film capacitors under curvature ». Affiche présentée lors de la conférence : MRS Materials Research Society Fall Meeting & Exhibit (Boston, MA, USA, Nov. 26-Dec. 01, 2017).

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Item Type: Poster
Professor:
Professor
Shih, Andy
Affiliation: Autres
Date Deposited: 04 Oct 2021 17:54
Last Modified: 04 Oct 2021 17:54
URI: https://espace2.etsmtl.ca/id/eprint/23253

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