Lee, J., Chon, M. W., Kim, H., Rathi, Y., Bouix, S., Shenton, M. E. and Kubicki, M..
2018.
« Diagnostic value of structural and diffusion imaging measures in schizophrenia ».
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Compte des citations dans Scopus : 33.
Rechercher dans Google Scholar
Official URL: https://doi.org/10.1016/j.nicl.2018.02.007
| Item Type: | Peer reviewed article published in a journal |
|---|---|
| Professor: | Professor Bouix, Sylvain |
| Affiliation: | Autres |
| Date Deposited: | 22 Jun 2022 17:05 |
| Last Modified: | 22 Jun 2022 17:05 |
| URI: | https://espace2.etsmtl.ca/id/eprint/24676 |
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