An automated non-linear transistor characterization system with a high-level language user-interface for easy control, visualization and data management

Ghannouchi, F. M., Kouki, A. B. and Beauregard, F.. 1993. « An automated non-linear transistor characterization system with a high-level language user-interface for easy control, visualization and data management ». In 41st ARFTG Conference Digest - Spring 1993 (Atlanta, GA, USA, June 18, 1993) pp. 18-23. Institute of Electrical and Electronics Engineers Inc..
Compte des citations dans Scopus : 1.

The full text of this document is not available here.

Item Type:	Conference proceeding
Professor:	Professor Kouki, Ammar B.
Affiliation:	Autres
Date Deposited:	19 Sep 2022 14:27
Last Modified:	19 Sep 2022 14:27
URI:	https://espace2.etsmtl.ca/id/eprint/25331

Actions (login required)

View Item