Bendali, A., Labedan, R., Domingue, F. and Nerguizian, Vahé.
2006.
« Holes effects on RF MEMS parallel membranes capacitors ».
In Canadian Conference on Electrical and Computer Engineering (CCECE) (Ottawa, Canada, May 7-10, 2006)
pp. 2140-2143.
Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.
Compte des citations dans Scopus : 14.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/CCECE.2006.277600
| Item Type: | Conference proceeding |
|---|---|
| ISBN: | 1-4244-0038-4 |
| Professor: | Professor Nerguizian, Vahé |
| Affiliation: | Génie électrique |
| Date Deposited: | 30 Oct 2012 18:17 |
| Last Modified: | 20 Aug 2015 14:34 |
| URI: | https://espace2.etsmtl.ca/id/eprint/2664 |
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