Bendali, A., Labedan, R., Domingue, F. et Nerguizian, Vahé.
2006.
« Holes effects on RF MEMS parallel membranes capacitors ».
In Canadian Conference on Electrical and Computer Engineering (CCECE) (Ottawa, Canada, May 7-10, 2006), pp. 2140-2143.
Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.
Compte des citations dans Scopus : 9.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/CCECE.2006.277600
| Item Type: | Conference proceeding | ||
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| Affiliation: | Génie électrique | ||
| Date Deposited: | 30 Oct 2012 18:17 | ||
| Last Modified: | 20 Aug 2015 14:34 | ||
| URI: | https://espace2.etsmtl.ca/id/eprint/2664 |
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