Customization of an atomic force microscope for multidimensional measurements under environmental conditions

Guner, Bugrahan, Laflamme, Simon and Dagdeviren, Omur E.. 2023. « Customization of an atomic force microscope for multidimensional measurements under environmental conditions ». Review of Scientific Instruments, vol. 94, nº 6.
Compte des citations dans Scopus : 4.

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Item Type:	Peer reviewed article published in a journal
Professor:	Professor Dagdeviren, Omur
Affiliation:	Génie mécanique
Date Deposited:	26 Jul 2023 17:54
Last Modified:	26 Jul 2023 17:54
URI:	https://espace2.etsmtl.ca/id/eprint/27091

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