Hobeika, Christelle, Thibeault, Claude et Boland, Jean-François.
2009.
« Automatic verification methodology based on structural test patterns ».
In Joint IEEE North-East Workshop on Circuits and Systems and Taisa Conference (NEWCAS-TAISA) (Toulouse, France, June 28-July 01, 2009)
pp. 292-295.
New York, NY, USA : Institute of Electrical and Electronics Engineers.
Compte des citations dans Scopus : 2.
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Item Type: |
Conference proceeding
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ISBN: |
978-1-4244-4573-8 |
Professor: |
Thibeault, Claude | Boland, Jean-François |
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Affiliation: |
Génie électrique |
Date Deposited: |
30 Oct 2012 18:18 |
Last Modified: |
05 Apr 2018 15:08 |
URI: |
https://espace2.etsmtl.ca/id/eprint/2758 |
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