Ensemble AI fault diagnosis model using ultrasonic microphone

Moshrefi, Amir Hossein, Gratuze, Mathieu, Tawfik, Hani H., Elsayed, Mohannad Y. and Nabki, Frederic. 2023. « Ensemble AI fault diagnosis model using ultrasonic microphone ». In IEEE International Ultrasonics Symposium (IUS) (Montreal, QC, Canada, Sept. 03-08, 2023) IEEE Computer Society.
Compte des citations dans Scopus : 3.

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Item Type:	Conference proceeding
Professor:	Professor Nabki, Frédéric
Affiliation:	Génie électrique
Date Deposited:	18 Dec 2023 19:40
Last Modified:	18 Dec 2023 19:40
URI:	https://espace2.etsmtl.ca/id/eprint/28206

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