A spectral profiling method of mm-wave and terahertz radiation sources

Al Hadi, R., Zhao, Y., Li, Y., Du, Y., Curwen, C., Williams, B. S. and Chang, M. C. F.. 2016. « A spectral profiling method of mm-wave and terahertz radiation sources ». In IEEE MTT-S International Microwave Symposium Digest (San Francisco, CA, USA, May 22-27, 2016) Institute of Electrical and Electronics Engineers Inc..
Compte des citations dans Scopus : 3.

The full text of this document is not available here.

Item Type:	Conference proceeding
Professor:	Professor Al Hadi, Richard
Affiliation:	Autres
Date Deposited:	05 Jun 2024 13:28
Last Modified:	05 Jun 2024 13:28
URI:	https://espace2.etsmtl.ca/id/eprint/28707

Actions (login required)

View Item