Rojczyk, Philine, Seitz-Holland, Johanna, Heller, Carina, Marcolini, Sofia, Marshall, Amy D., Sydnor, Valerie J., Kaufmann, Elisabeth, Jung, Leonard B., Bonke, Elena M., Berger, Luisa, Umminger, Lisa F., Wiegand, Tim L. T., Cho, Kang Ik K., Rathi, Yogesh, Bouix, Sylvain, Pasternak, Ofer, Hinds, Sidney R., Fortier, Catherine B., Salat, David, Milberg, William P., Shenton, Martha E. and Koerte, Inga K..
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« Posttraumatic survivor guilt is associated with white matter microstructure alterations ».
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Official URL: https://doi.org/10.1016/j.jad.2024.06.047
| Item Type: | Peer reviewed article published in a journal |
|---|---|
| Professor: | Professor Bouix, Sylvain |
| Affiliation: | Génie logiciel et des technologies de l'information |
| Date Deposited: | 30 Jul 2024 18:56 |
| Last Modified: | 30 Jul 2024 18:56 |
| URI: | https://espace2.etsmtl.ca/id/eprint/29032 |
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