Marìn, Beatriz, Giachetti, Giovanni, Pastor, Oscar, Vos, Tanja E. J. et Abran, Alain.
2010.
« Evaluating the usefulness of a functional size measurement procedure to detect defects in MDD models ».
In 4th International Symposium on Empirical Software Engineering and Measurement (ESEM) (Bolzano-Bozen, Italy, Sept. 16-17, 2010)
New York, NY, USA : Association for Computing Machinery.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1145/1852786.1852849
Item Type: | Conference proceeding | ||
---|---|---|---|
Additional Information: | ESEM 2010 | ||
Professor: |
|
||
Affiliation: | Génie logiciel et des technologies de l'information | ||
Date Deposited: | 23 May 2012 17:55 | ||
Last Modified: | 23 May 2012 17:55 | ||
URI: | https://espace2.etsmtl.ca/id/eprint/291 |
Actions (login required)
![]() |
View Item |