Evaluating the usefulness of a functional size measurement procedure to detect defects in MDD models

Marìn, Beatriz, Giachetti, Giovanni, Pastor, Oscar, Vos, Tanja E. J. et Abran, Alain. 2010. « Evaluating the usefulness of a functional size measurement procedure to detect defects in MDD models ». In 4th International Symposium on Empirical Software Engineering and Measurement (ESEM) (Bolzano-Bozen, Italy, Sept. 16-17, 2010) New York, NY, USA : Association for Computing Machinery.

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Item Type:	Conference proceeding
Additional Information:	ESEM 2010
Professor:	Professor Abran, Alain
Affiliation:	Génie logiciel et des technologies de l'information
Date Deposited:	23 May 2012 17:55
Last Modified:	23 May 2012 17:55
URI:	https://espace2.etsmtl.ca/id/eprint/291

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