On the test quality evaluation of current testing techniques

Thibeault, Claude. 2005. « On the test quality evaluation of current testing techniques ». In IEEE International Workshop on Current and Defect Based Testing (DBT) (Palm Springs, CA, USA, May 1, 2005) pp. 16-22. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers Computer Society.
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Item Type:	Conference proceeding
ISBN:	1-4244-0034-1
Professor:	Professor Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	30 Oct 2012 18:19
Last Modified:	30 Oct 2012 18:19
URI:	https://espace2.etsmtl.ca/id/eprint/2941

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