On captureless delay test points

Thibeault, Claude, Hariri, Y. and Hobeika, Christelle. 2009. « On captureless delay test points ». In Joint IEEE North-East Workshop on Circuits and Systems and Taisa Conference (NEWCAS-TAISA) (Toulouse, France, June 28-July 01, 2009) pp. 280-283. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.
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Item Type:	Conference proceeding
ISBN:	978-1-4244-4573-8
Professor:	Professor Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	30 Oct 2012 18:19
Last Modified:	30 Oct 2012 18:19
URI:	https://espace2.etsmtl.ca/id/eprint/2944

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