Thibeault, C., Tremblay, D. and Hariri, Y..
2006.
« Redefining the role of functional testing ».
In IEEE North-East Workshop on Circuits and Systems (NEWCAS) (Gatineau, Que., Canada, June 18-21, 2006)
pp. 133-136.
Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.
Compte des citations dans Scopus : 1.
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Official URL: http://dx.doi.org/10.1109/NEWCAS.2006.250947
| Item Type: | Conference proceeding |
|---|---|
| ISBN: | 1-4244-0416-9 |
| Professor: | Professor Thibeault, Claude |
| Affiliation: | Génie électrique |
| Date Deposited: | 30 Oct 2012 18:19 |
| Last Modified: | 09 Jan 2017 19:57 |
| URI: | https://espace2.etsmtl.ca/id/eprint/2945 |
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