Bridging expert knowledge and sensor measurements for machine fault quantification with large language models

Jose, Sagar, Nguyen, Khanh T. P., Medjaher, Kamal, Zemouri, Ryad, Lévesque, Mélanie and Tahan, Antoine. 2024. « Bridging expert knowledge and sensor measurements for machine fault quantification with large language models ». In IEEE/ASME International Conference on Advanced Intelligent Mechatronics (AIM) (Boston, MA, USA, July 15-19, 2024) pp. 530-535. Institute of Electrical and Electronics Engineers Inc..
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Item Type:	Conference proceeding
Professor:	Professor Tahan, Antoine
Affiliation:	Génie mécanique
Date Deposited:	18 Oct 2024 20:27
Last Modified:	18 Oct 2024 20:27
URI:	https://espace2.etsmtl.ca/id/eprint/29657

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