Kececi, Nihal, Garbajosa, Juan and Bourque, Pierre.
2006.
« Modeling functional requirements to support traceability analysis ».
In IEEE International Symposium on Industrial Electronics (ISIE) (Montreal, Canada, Jul. 9-13, 2006)
pp. 3305-3310.
Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.
Compte des citations dans Scopus : 2.
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Official URL: http://dx.doi.org/10.1109/ISIE.2006.295995
Item Type: | Conference proceeding |
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ISBN: | 1-4244-0496-7 |
Professor: | Professor Bourque, Pierre |
Affiliation: | Génie logiciel et des technologies de l'information |
Date Deposited: | 30 Oct 2012 18:19 |
Last Modified: | 30 Oct 2012 18:19 |
URI: | https://espace2.etsmtl.ca/id/eprint/3006 |
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