CoMet : a tool using CUMM to measure unused components members

Msheik, Hamdam, Abran, Alain, Mcheick, Hamad, Touloumis, Dimitrios and Khelifi, Adel. 2006. « CoMet : a tool using CUMM to measure unused components members ». In IEEE International Conference on Computer Systems and Applications (Sharjah, United Arab Emirates, March 8, 2006) pp. 697-703. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers Computer Society.

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Item Type:	Conference proceeding
ISBN:	1-4244-0211-5
Professor:	Professor Abran, Alain
Affiliation:	Génie logiciel et des technologies de l'information
Date Deposited:	30 Oct 2012 18:19
Last Modified:	30 Oct 2012 18:19
URI:	https://espace2.etsmtl.ca/id/eprint/3013

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