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Ultrasonic testing for defect detection

Bélanger, Pierre and Latete, Thibault (inventeurs) 21 January 2025. « Ultrasonic testing for defect detection ». École de technologie supérieure (titulaire(s)). Brevet américain US 12,203,897.

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Item Type: Patents (Brevet américain)
Professor:
Professor
Bélanger, Pierre
Affiliation: Génie mécanique
Date Deposited: 06 Feb 2025 17:21
Last Modified: 06 Feb 2025 17:21
URI: https://espace2.etsmtl.ca/id/eprint/30515

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