LP plus plus : A surprisingly strong linear probe for few-shot CLIP

Huang, Yunshi, Shakeri, Fereshteh, Dolz, Jose, Boudiaf, Malik, Bahig, Houda and Ben Ayed, Ismail. 2024. « LP plus plus : A surprisingly strong linear probe for few-shot CLIP ». In IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (Seattle, WA, USA, June 16-22, 2024) pp. 23773-23782. Institute of Electrical and Electonics Engineers Inc..
Compte des citations dans Scopus : 3.

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Item Type:	Conference proceeding
ISBN:	979-8-3503-5300-6
Professor:	Professor Dolz, José Ben Ayed, Ismail
Affiliation:	Génie logiciel et des technologies de l'information, Génie des systèmes
Date Deposited:	13 Feb 2025 16:42
Last Modified:	13 Feb 2025 16:42
URI:	https://espace2.etsmtl.ca/id/eprint/30527

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