TEV sensor-based PD measurements with a focus on PRPD patterns and FFT Analysis

Abbasi, Mahdi, Lachance, Mathieu and David, Eric. 2025. « TEV sensor-based PD measurements with a focus on PRPD patterns and FFT Analysis ». In IEEE Electrical Insulation Conference (EIC) (South Padre Island, TX, USA, June 08-11, 2025) Institute of Electrical and Electronics Engineers Inc..

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Item Type:	Conference proceeding
Professor:	Professor David, Éric
Affiliation:	Génie mécanique
Date Deposited:	23 Oct 2025 16:05
Last Modified:	23 Oct 2025 16:05
URI:	https://espace2.etsmtl.ca/id/eprint/32607

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