Realistic test-time adaptation of vision-language models

Zanella, Maxime, Fuchs, Clément, De Vleeschouwer, Christophe and Ben Ayed, Ismail. 2025. « Realistic test-time adaptation of vision-language models ». In IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) (Nashville, TN, USA, June 10-17, 2025) pp. 25103-25112. IEEE.

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Official URL: https://doi.org/10.1109/CVPR52734.2025.02337

Item Type:	Conference proceeding
ISBN:	979-8-3315-4365-5, 979-8-3315-4364-8
Researcher:	Researcher Ben Ayed, Ismail
Affiliation:	Génie des systèmes
Date Deposited:	19 Feb 2026 17:01
Last Modified:	19 Feb 2026 17:01
URI:	https://espace2.etsmtl.ca/id/eprint/33370

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