Sami, A., David, Éric et Fréchette, Michel F..
2010.
« Procedure for evaluating the crystallinity from X-ray diffraction scans of high and low density polyethylene/SiO2 composites ».
In IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) (West Lafayette, USA, Oct. 17-20, 2010)
pp. 1-4.
Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers (IEEE).
Compte des citations dans Scopus : 8.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/CEIDP.2010.5724069
Item Type: | Conference proceeding |
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Additional Information: | 2010 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) |
Professor: | Professor David, Éric |
Affiliation: | Génie mécanique |
Date Deposited: | 23 May 2012 17:55 |
Last Modified: | 13 Apr 2023 16:08 |
URI: | https://espace2.etsmtl.ca/id/eprint/342 |
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