Procedure for evaluating the crystallinity from X-ray diffraction scans of high and low density polyethylene/SiO2 composites

Sami, A., David, Éric et Fréchette, Michel F.. 2010. « Procedure for evaluating the crystallinity from X-ray diffraction scans of high and low density polyethylene/SiO2 composites ». In IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) (West Lafayette, USA, Oct. 17-20, 2010) pp. 1-4. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers (IEEE).
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Item Type:	Conference proceeding
Additional Information:	2010 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (CEIDP)
Professor:	Professor David, Éric
Affiliation:	Génie mécanique
Date Deposited:	23 May 2012 17:55
Last Modified:	13 Apr 2023 16:08
URI:	https://espace2.etsmtl.ca/id/eprint/342

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