Testing for parasitic memory effect in SRAMs

Irobi, Sandra, Al-Ars, Zaid, Hamdioui, Said and Thibeault, Claude. 2011. « Testing for parasitic memory effect in SRAMs ». In 20th Asian Test Symposium (ATS) (New Delhi, India, Nov. 20-23, 2011) pp. 407-412. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.
Compte des citations dans Scopus : 1.

The full text of this document is not available here.

Item Type:	Conference proceeding
ISBN:	978-1-4577-1984-4
Professor:	Professor Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	18 Apr 2013 19:02
Last Modified:	18 Apr 2013 19:02
URI:	https://espace2.etsmtl.ca/id/eprint/4210

Actions (login required)

View Item