Irobi, Sandra, Al-Ars, Zaid, Hamdioui, Said and Thibeault, Claude.
2011.
« Testing for parasitic memory effect in SRAMs ».
In 20th Asian Test Symposium (ATS) (New Delhi, India, Nov. 20-23, 2011)
pp. 407-412.
Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.
Compte des citations dans Scopus : 1.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/ATS.2011.76
Item Type: | Conference proceeding |
---|---|
ISBN: | 978-1-4577-1984-4 |
Professor: | Professor Thibeault, Claude |
Affiliation: | Génie électrique |
Date Deposited: | 18 Apr 2013 19:02 |
Last Modified: | 18 Apr 2013 19:02 |
URI: | https://espace2.etsmtl.ca/id/eprint/4210 |
Actions (login required)
View Item |