IGBT advanced model used on degraded mode analysis

Charfi, F., François, B., Ben Messaoud, M., Al-Haddad, Kamal and Sellami, F.. 2002. « IGBT advanced model used on degraded mode analysis ». In IEEE International Conference on Systems, Man and Cybernetics (Hammamet, Tunisia, Oct. 6-9, 2002) pp. 473-478. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.

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Item Type:	Conference proceeding
ISBN:	0-7803-7437-1
Professor:	Professor Al Haddad, Kamal
Affiliation:	Génie électrique
Date Deposited:	18 Apr 2013 19:03
Last Modified:	18 Apr 2013 19:03
URI:	https://espace2.etsmtl.ca/id/eprint/4516

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