On the use of wavelet analysis for IC testing

Dia, Aminata, Thibeault, Claude, Gargour, Christian et Houle, Jean Louis. 1999. « On the use of wavelet analysis for IC testing ». In Troisième conférence internationale sur l'automatisation industrielle, École de technologie supérieure, Montréal, 7-9 juin 1999 : actes de la conférence = Third International Conference on Industrial Automation, École de technologie supérieure, Montréal, (Montreal, Canada, June 7-9, 1999) 21/9-21/12. Montreal, Canada : International Associaion of Industrial Automation.

The full text of this document is not available here.

Item Type:	Conference proceeding
ISBN:	2 9802946 2 4
Editors:	Editors ORCID Bogdadi, Guy UNSPECIFIED
Professor:	Professor Thibeault, Claude Gargour, Christian
Affiliation:	Génie électrique
Date Deposited:	18 Apr 2013 19:03
Last Modified:	13 Oct 2015 13:55
URI:	https://espace2.etsmtl.ca/id/eprint/4527

Actions (login required)

View Item