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On the use of wavelet analysis for IC testing

Dia, Aminata, Thibeault, Claude, Gargour, Christian et Houle, Jean Louis. 1999. « On the use of wavelet analysis for IC testing ». In Troisième conférence internationale sur l'automatisation industrielle, École de technologie supérieure, Montréal, 7-9 juin 1999 : actes de la conférence = Third International Conference on Industrial Automation, École de technologie supérieure, Montréal, (Montreal, Canada, June 7-9, 1999), 21/9-21/12. Montreal, Canada : International Associaion of Industrial Automation.

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Item Type: Conference proceeding
Editors:
EditorsORCID
Bogdadi, GuyUNSPECIFIED
Professor:
Professor
Thibeault, Claude
Gargour, Christian
Affiliation: Génie électrique
Date Deposited: 18 Apr 2013 19:03
Last Modified: 13 Oct 2015 13:55
URI: https://espace2.etsmtl.ca/id/eprint/4527

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