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3DSDM : a 3 data-source diagnostic method

Hariri, Yassine and Thibeault, Claude. 2003. « 3DSDM : a 3 data-source diagnostic method ». In 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Boston, MA, USA, Nov. 3-5, 2003) pp. 117-123. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.
Compte des citations dans Scopus : 5.

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Item Type: Conference proceeding
ISBN: 0-7695-2042-1
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 18 Apr 2013 19:03
Last Modified: 18 Apr 2013 19:03

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