Hariri, Yassine and Thibeault, Claude.
2003.
« 3DSDM : a 3 data-source diagnostic method ».
In 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Boston, MA, USA, Nov. 3-5, 2003)
pp. 117-123.
Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.
Compte des citations dans Scopus : 5.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/DFTVS.2003.1250102
| Item Type: | Conference proceeding |
|---|---|
| ISBN: | 0-7695-2042-1 |
| Professor: | Professor Thibeault, Claude |
| Affiliation: | Génie électrique |
| Date Deposited: | 18 Apr 2013 19:03 |
| Last Modified: | 18 Apr 2013 19:03 |
| URI: | https://espace2.etsmtl.ca/id/eprint/4577 |
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