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A cost model for VLSI/MCM systems

Kafrouni, M., Thibeault, Claude et Savaria, Yvon. 1997. « A cost model for VLSI/MCM systems ». In IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Paris, France, Oct. 20-22, 1997), pp. 148-156. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.

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Item Type: Conference proceeding
Professor:
Professor
Thibeault, Claude
Affiliation: Génie électrique
Date Deposited: 18 Apr 2013 19:03
Last Modified: 18 Apr 2013 19:03
URI: https://espace2.etsmtl.ca/id/eprint/4590

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