Using sinusoidal stimuli and Fourier analyses for memory IC testing

Thibeault, Claude. 1994. « Using sinusoidal stimuli and Fourier analyses for memory IC testing ». In IEEE International Workshop on Memory Technology, Design and Testing (San Jose, CA, USA, Aug. 8-9, 1994) pp. 92-97. Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.
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Item Type:	Conference proceeding
ISBN:	0-8186-6245-X
Professor:	Professor Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	18 Apr 2013 19:04
Last Modified:	18 Apr 2013 19:04
URI:	https://espace2.etsmtl.ca/id/eprint/4714

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