Thibeault, Claude.
1994.
« Using sinusoidal stimuli and Fourier analyses for memory IC testing ».
In IEEE International Workshop on Memory Technology, Design and Testing (San Jose, CA, USA, Aug. 8-9, 1994)
pp. 92-97.
Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.
Compte des citations dans Scopus : 1.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/MTDT.1994.397191
| Item Type: | Conference proceeding | ||
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| ISBN: | 0-8186-6245-X | ||
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| Affiliation: | Génie électrique | ||
| Date Deposited: | 18 Apr 2013 19:04 | ||
| Last Modified: | 18 Apr 2013 19:04 | ||
| URI: | https://espace2.etsmtl.ca/id/eprint/4714 |
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