Thibeault, Claude.
2000.
« Improving Delta-IDDQ-based test methods ».
In International Test Conference (Atlantic City, NJ, USA, Oct. 3-5, 2000)
pp. 207-216.
Piscataway, NJ, USA : Institute of Electrical and Electronics Engineers.
Compte des citations dans Scopus : 23.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/TEST.2000.894208
Item Type: | Conference proceeding |
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ISBN: | 0-7803-6546-1 |
Professor: | Professor Thibeault, Claude |
Affiliation: | Génie électrique |
Date Deposited: | 18 Apr 2013 19:04 |
Last Modified: | 18 Apr 2013 19:04 |
URI: | https://espace2.etsmtl.ca/id/eprint/4720 |
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