Can the current behavior of faulty and fault-free ICs and the impact on diagnosis

Thibeault, Claude and Boisvert, L.. 1998. « Can the current behavior of faulty and fault-free ICs and the impact on diagnosis ». In IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (Austin, TX, USA, Nov. 2-4, 1998) pp. 202-210. Los Alamitos, CA, USA : Institute of Electrical and Electronics Engineers Computer Society.
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Item Type:	Conference proceeding
ISBN:	0-8186-8832-7
Professor:	Professor Thibeault, Claude
Affiliation:	Génie électrique
Date Deposited:	18 Apr 2013 19:04
Last Modified:	18 Apr 2013 19:04
URI:	https://espace2.etsmtl.ca/id/eprint/4724

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