Thibeault, Claude, Pichette, Simon, Audet, Yves, Savaria, Yvon, Rufenacht, H., Gloutnay, E., Blaquière, Yves, Moupfouma, F. and Batani, Naïm.
2012.
« On extra combinational delays in SRAM FPGAs due to transient ionizing radiations ».
IEEE Transactions on Nuclear Science, vol. 59, nº 6.
pp. 2959-2965.
Compte des citations dans Scopus : 9.
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Official URL: http://dx.doi.org/10.1109/TNS.2012.2222668
Item Type: | Peer reviewed article published in a journal |
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Professor: | Professor Thibeault, Claude Blaquière, Yves Batani, Naïm |
Affiliation: | Génie électrique, Autres, Génie électrique |
Date Deposited: | 03 Jul 2013 18:41 |
Last Modified: | 20 Feb 2017 19:12 |
URI: | https://espace2.etsmtl.ca/id/eprint/4836 |
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