St-Louis, Dominique et Suryn, Witold.
2012.
« Enhancing ISO/IEC 25021 quality measure elements for wider application within ISO 25000 series ».
In 38th Annual Conference on IEEE Industrial Electronics Society, IECON 2012 (Montreal, QC, Canada, Oct. 25-28, 2012)
pp. 3120-3125.
Washington, DC : IEEE Computer Society.
Compte des citations dans Scopus : 4.
Rechercher dans Google Scholar
Official URL: http://dx.doi.org/10.1109/IECON.2012.6389400
Item Type: | Conference proceeding |
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Professor: | Professor Suryn, Witold |
Affiliation: | Génie logiciel et des technologies de l'information |
Date Deposited: | 24 Jul 2013 20:43 |
Last Modified: | 24 Jul 2013 20:43 |
URI: | https://espace2.etsmtl.ca/id/eprint/5070 |
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